Thermionic field emission at electrodeposited Ni-Si Schottky barriers

Current transport at Schottky barriers is of particular interest for spin injection and detection in semiconductors. Here, electrodeposited Ni-Si contacts are fabricated and the transport mechanisms through the formed Schottky barrier are studied. Highly doped Si is used to enable tunneling currents...

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Bibliographic Details
Main Authors: Kiziroglou, M. E. (Author), Li, X. (Author), Zhukov, A. A. (Author), de Groot, P.A.J (Author), de Groot, C.H (Author)
Format: Article
Language:English
Published: 2008-07.
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