UV Sensor Based on Surface Acoustic Waves in ZnO/Fused Silica

Zinc oxide (ZnO) thin films have been grown by radio frequency sputtering technique on fused silica substrates. Optical and morphological characteristics of as-grown ZnO samples were measured by various techniques; an X-ray diffraction spectrum showed that the films exhibited hexagonal wurtzite stru...

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Bibliographic Details
Main Authors: Benetti, M. (Author), Buzzin, A. (Author), Caliendo, C. (Author), Cannatà, D. (Author), de Cesare, G. (Author), Grossi, F. (Author), Verona, E. (Author)
Format: Article
Language:English
Published: MDPI 2023
Subjects:
SAW
ZnO
Online Access:View Fulltext in Publisher
View in Scopus
LEADER 04104nam a2200625Ia 4500
001 10.3390-s23094197
008 230529s2023 CNT 000 0 und d
020 |a 14248220 (ISSN) 
245 1 0 |a UV Sensor Based on Surface Acoustic Waves in ZnO/Fused Silica 
260 0 |b MDPI  |c 2023 
856 |z View Fulltext in Publisher  |u https://doi.org/10.3390/s23094197 
856 |z View in Scopus  |u https://www.scopus.com/inward/record.uri?eid=2-s2.0-85159157545&doi=10.3390%2fs23094197&partnerID=40&md5=6a5157af9efac2686766831bafbc157a 
520 3 |a Zinc oxide (ZnO) thin films have been grown by radio frequency sputtering technique on fused silica substrates. Optical and morphological characteristics of as-grown ZnO samples were measured by various techniques; an X-ray diffraction spectrum showed that the films exhibited hexagonal wurtzite structure and were c-axis-oriented normal to the substrate surface. Scanning electron microscopy images showed the dense columnar structure of the ZnO layers, and light absorption measurements allowed us to estimate the penetration depth of the optical radiation in the 200 to 480 nm wavelength range and the ZnO band-gap. ZnO layers were used as a basic material for surface acoustic wave (SAW) delay lines consisting of two Al interdigitated transducers (IDTs) photolithographically implemented on the surface of the piezoelectric layer. The Rayleigh wave propagation characteristics were tested in darkness and under incident UV light illumination from the top surface of the ZnO layer and from the fused silica/ZnO interface. The sensor response, i.e., the wave velocity shift due to the acoustoelectric interaction between the photogenerated charge carriers and the electric potential associated with the acoustic wave, was measured for different UV power densities. The reversibility and repeatability of the sensor responses were assessed. The time response of the UV sensor showed a rise time and a recovery time of about 10 and 13 s, respectively, and a sensitivity of about 318 and 341 ppm/(mW/cm2) for top and bottom illumination, respectively. The ZnO/fused silica-based SAW UV sensors can be interrogated across the fused silica substrate thanks to its optical transparency in the UV range. The backlighting interrogation can find applications in harsh environments, as it prevents the sensing photoconductive layer from aggressive environmental effects or from any damage caused by cleaning the surface from dust which could deteriorate the sensor’s performance. Moreover, since the SAW sensors, by their operating principle, are suitable for wireless reading via radio signals, the ZnO/fused-silica-based sensors have the potential to be the first choice for UV sensing in harsh environments. © 2023 by the authors. 
650 0 4 |a Acoustic surface wave devices 
650 0 4 |a Acoustic waves 
650 0 4 |a acoustoelectric effect 
650 0 4 |a Electric potential 
650 0 4 |a Energy gap 
650 0 4 |a fused silica 
650 0 4 |a Fused silica 
650 0 4 |a Fused silica substrates 
650 0 4 |a Harsh environment 
650 0 4 |a II-VI semiconductors 
650 0 4 |a Incident light 
650 0 4 |a Light absorption 
650 0 4 |a Oxide films 
650 0 4 |a Oxide layer 
650 0 4 |a photoconductivity 
650 0 4 |a Photoconductivity 
650 0 4 |a Piezoelectricity 
650 0 4 |a Radio frequency sputtering 
650 0 4 |a SAW 
650 0 4 |a Scanning electron microscopy 
650 0 4 |a Sensor response 
650 0 4 |a sensors 
650 0 4 |a Sputtering 
650 0 4 |a Sputtering techniques 
650 0 4 |a Substrates 
650 0 4 |a Surface acoustic waves 
650 0 4 |a UV light 
650 0 4 |a UV sensor 
650 0 4 |a UV-light 
650 0 4 |a Wave propagation 
650 0 4 |a Zinc oxide 
650 0 4 |a Zinc oxide thin films 
650 0 4 |a Zinc sulfide 
650 0 4 |a ZnO 
700 1 0 |a Benetti, M.  |e author 
700 1 0 |a Buzzin, A.  |e author 
700 1 0 |a Caliendo, C.  |e author 
700 1 0 |a Cannatà, D.  |e author 
700 1 0 |a de Cesare, G.  |e author 
700 1 0 |a Grossi, F.  |e author 
700 1 0 |a Verona, E.  |e author 
773 |t Sensors