Structural studies of Zno Nanostructures on Porous Silicon: Effect of post-annealing temperature
ZnO Nanostructures have been successfully deposited on of Porous silicon (PSi) via wet colloid chemical approach. PSi was prepared by electrochemical etching method. ZnO/PSi thin films were annealed in different temperature in the range of 300 °C to 700 °C. Surface morphology studies were conducted...
| Main Authors: | , , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
Science Publishing Corporation Inc
2018
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| Subjects: | |
| Online Access: | View Fulltext in Publisher View in Scopus |