Gate Drive Circuit Suitable for a GaN Gate Injection Transistor

A GaN gate injection transistor (GIT) has great potential as a power semiconductor device. However, a GaN GIT has a diode characteristic at the gate-source, and a corresponding gate drive circuit is thus required. Several studies in the literature have proposed the gate drive circuits with the speed...

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Bibliographic Details
Main Authors: Hattori, F. (Author), Imaoka, J. (Author), Yamamoto, M. (Author), Yanagisawa, Y. (Author)
Format: Article
Language:English
Published: Institute of Electrical and Electronics Engineers Inc. 2023
Subjects:
Online Access:View Fulltext in Publisher
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008 230529s2023 CNT 000 0 und d
020 |a 21693536 (ISSN) 
245 1 0 |a Gate Drive Circuit Suitable for a GaN Gate Injection Transistor 
260 0 |b Institute of Electrical and Electronics Engineers Inc.  |c 2023 
300 |a 1 
856 |z View Fulltext in Publisher  |u https://doi.org/10.1109/ACCESS.2023.3270261 
856 |z View in Scopus  |u https://www.scopus.com/inward/record.uri?eid=2-s2.0-85159695928&doi=10.1109%2fACCESS.2023.3270261&partnerID=40&md5=7186c7da984e846cdb01296165f36668 
520 3 |a A GaN gate injection transistor (GIT) has great potential as a power semiconductor device. However, a GaN GIT has a diode characteristic at the gate-source, and a corresponding gate drive circuit is thus required. Several studies in the literature have proposed the gate drive circuits with the speed-up capacitors, but adding these capacitors complicates the gate drive circuit, and increases both the drive and reverse conduction losses. Moreover, driving a GaN GIT with such gate drive circuits becomes more susceptible to the false turn-on. In this paper, a gate drive circuit suitable for a GaN GIT without a speed-up capacitor is proposed. This type can provide the high-speed switching, and exhibit the low gate drive loss and reverse conduction loss. The proposed circuit also has high immunity against the false turn-on and stable gate-source voltage before and after startup. The drive loss of the proposed type is calculated and its validity is confirmed experimentally. Furthermore, the drive loss of the proposed type is compared with the conventional circuits. The result shows that the drive loss of the proposed type is improved by up to 50 %, compared with the conventional type. Finally, the proposed type is experimentally tested to drive a buck converter at the switching frequency of 150 kHz. The entire loss of the converter can be reduced by up to 9.2% at 250 W, compared with the conventional type. Author 
650 0 4 |a Capacitors 
650 0 4 |a Conduction loss 
650 0 4 |a DC-DC converters 
650 0 4 |a Diode characteristics 
650 0 4 |a Gallium nitride 
650 0 4 |a Gate drive circuit 
650 0 4 |a Gate drive circuits 
650 0 4 |a gate drive loss 
650 0 4 |a Gate drive loss 
650 0 4 |a Gate drivers 
650 0 4 |a Gate drives 
650 0 4 |a Gate injection transistors 
650 0 4 |a III-V semiconductors 
650 0 4 |a Logic gates 
650 0 4 |a Resistors 
650 0 4 |a Reverse conduction 
650 0 4 |a reverse conduction loss 
650 0 4 |a Reverse conduction loss 
650 0 4 |a Semiconducting gallium compounds 
650 0 4 |a Speed up 
650 0 4 |a Switches 
650 0 4 |a Switching circuits 
650 0 4 |a Time switches 
650 0 4 |a Timing circuits 
650 0 4 |a Transistors 
650 0 4 |a Voltage 
650 0 4 |a Wide band gap semiconductors 
700 1 0 |a Hattori, F.  |e author 
700 1 0 |a Imaoka, J.  |e author 
700 1 0 |a Yamamoto, M.  |e author 
700 1 0 |a Yanagisawa, Y.  |e author 
773 |t IEEE Access