Aging analysis of high performance FinFET flip-flop under Dynamic NBTI simulation configuration
A mechanism known as Negative-bias Temperature Instability (NBTI) degrades a main electrical parameters of a circuit especially in terms of performance. So far, the circuit design available at present are only focussed on high performance circuit without considering the circuit reliability and robus...
| Main Authors: | , , , |
|---|---|
| Format: | Article |
| Language: | English |
| Published: |
Institute of Physics Publishing
2018
|
| Subjects: | |
| Online Access: | View Fulltext in Publisher View in Scopus |