Local spectroscopic imaging of a single quantum dot in photoinduced force microscopy

Analysis of environmentally sensitive materials is essential for developing and optimizing nanostructured photochemical materials and devices. Photoinduced force microscopy (PiFM) is a promising local spectroscopic technique to visualize nanoscale local optical responses by measuring the optical for...

Full description

Bibliographic Details
Main Authors: Li, Y.J (Author), Naitoh, Y. (Author), Sugawara, Y. (Author), Yamane, H. (Author), Yamanishi, J. (Author)
Format: Article
Language:English
Published: American Institute of Physics Inc. 2022
Subjects:
Online Access:View Fulltext in Publisher