CAFM Studies of Epitaxial Lateral Overgrowth GaN Films
This thesis uses the techniques of atomic force microscopy (AFM) and conductiveAFM (CAFM) to study defect sites on GaN films. In particular, these defect sites demonstrate current leakage under reverse-bias conditions that are detrimental to device fabrication. Two growth techniques that were used t...
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VCU Scholars Compass
2007
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| Online Access: | http://scholarscompass.vcu.edu/etd/1412 http://scholarscompass.vcu.edu/cgi/viewcontent.cgi?article=2411&context=etd |