Insights from Scanning Transmission Electron Microscopy and X-Ray Diffraction Into the Structure and Composition of Non Crystalline Thin Solid Films
Non-crystalline thin solid films are seeing increasing interest for a wide variety of applications. However, understanding structure and compositional variations in these films is an immense challenge. Conventional bulk structural or compositional characterization techniques such as X-ray diffra...
| Main Author: | |
|---|---|
| Other Authors: | |
| Language: | en_US |
| Published: |
University of Oregon
2017
|
| Subjects: | |
| Online Access: | http://hdl.handle.net/1794/22273 |