Target Thickness Dependence of Cu K X-Ray Production for Ions Moving in Thin Solid Cu Targets
Measurements of the target thickness dependence of the target x-ray production yield for incident fast heavy ions are reported for thin solid Cu targets as a function of both incident projectile atomic number and energy. The incident ions were F, Al, Si, S, and CI. The charge state of the incident i...
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| Format: | Others |
| Language: | English |
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North Texas State University
1977
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| Online Access: | https://digital.library.unt.edu/ark:/67531/metadc332141/ |