Critical thicknesses in Nb-H thin films: coherent and incoherent phase transitions, change of precipitation and growth modes and ultrahigh mechanical stress

Critical thicknesses in Nb-H thin films: coherent and incoherent phase transitions, change of precipitation and growth modes and ultrahigh mechanical stress

Bibliographic Details
Main Author:	Burlaka, Vladimir
Other Authors:	Pundt, Astrid Prof. Dr.
Format:	Doctoral Thesis
Language:	English
Published:	2016
Subjects:	530 Physik (PPN621336750) Niobium Hydrogen thin films coherent / incoherent phase transition hydride formation critical film thickness mechanical stress critical temperature
Online Access:	http://hdl.handle.net/11858/00-1735-0000-0028-87E9-A http://nbn-resolving.de/urn:nbn:de:gbv:7-11858/00-1735-0000-0028-87E9-A-8

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