Critical thicknesses in Nb-H thin films: coherent and incoherent phase transitions, change of precipitation and growth modes and ultrahigh mechanical stress

Critical thicknesses in Nb-H thin films: coherent and incoherent phase transitions, change of precipitation and growth modes and ultrahigh mechanical stress

Bibliographic Details
Main Author: Burlaka, Vladimir
Other Authors: Pundt, Astrid Prof. Dr.
Format: Doctoral Thesis
Language:English
Published: 2016
Subjects:
530
Physik (PPN621336750)
Niobium
Hydrogen
thin films
coherent / incoherent phase transition
hydride formation
critical film thickness
mechanical stress
critical temperature
Online Access:http://hdl.handle.net/11858/00-1735-0000-0028-87E9-A
http://nbn-resolving.de/urn:nbn:de:gbv:7-11858/00-1735-0000-0028-87E9-A-8

Internet

http://hdl.handle.net/11858/00-1735-0000-0028-87E9-A
http://nbn-resolving.de/urn:nbn:de:gbv:7-11858/00-1735-0000-0028-87E9-A-8

Similar Items