Fault diagnosis of VLSI designs: cell internal faults and volume diagnosis throughput
The modern VLSI circuit designs manufactured with advanced technology nodes of 65nm or below exhibit an increasing sensitivity to the variations of manufacturing process. New design-specific and feature-sensitive failure mechanisms are on the rise. Systematic yield issues can be severe due to the co...
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| Language: | English |
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University of Iowa
2012
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| Online Access: | https://ir.uiowa.edu/etd/3450 https://ir.uiowa.edu/cgi/viewcontent.cgi?article=3451&context=etd |