Fault diagnosis of VLSI designs: cell internal faults and volume diagnosis throughput

Fault diagnosis of VLSI designs: cell internal faults and volume diagnosis throughput

The modern VLSI circuit designs manufactured with advanced technology nodes of 65nm or below exhibit an increasing sensitivity to the variations of manufacturing process. New design-specific and feature-sensitive failure mechanisms are on the rise. Systematic yield issues can be severe due to the co...

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Bibliographic Details
Main Author: Fan, Xiaoxin
Other Authors: Reddy, Sudhakar M.
Format: Others
Language:English
Published: University of Iowa 2012
Subjects:
Cell Internal Fault
Fault Diagnosis
Throughput
VLSI
Volume Diagnosis
Electrical and Computer Engineering
Online Access:https://ir.uiowa.edu/etd/3450
https://ir.uiowa.edu/cgi/viewcontent.cgi?article=3451&context=etd

Internet

https://ir.uiowa.edu/etd/3450
https://ir.uiowa.edu/cgi/viewcontent.cgi?article=3451&context=etd

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