On low power test and low power compression techniques
With the ever increasing integration capability of semiconductor technology, today's large integrated circuits require an increasing amount of data to test them which increases test time and elevated requirements of tester memory. At the same time, as VLSI design sizes and their operating frequ...
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| Format: | Others |
| Language: | English |
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University of Iowa
2011
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| Online Access: | https://ir.uiowa.edu/etd/997 https://ir.uiowa.edu/cgi/viewcontent.cgi?article=2382&context=etd |