Dynamic stability margin analysis on SRAM
In the past decade, aggressive scaling of transistor feature size has been a primary force driving higher Static Random Access Memory (SRAM) integration density. Due to the scaling, nanometer SRAM designs are getting more and more stability issues. The traditional way of analyzing stability is the S...
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Format: | Others |
Language: | en_US |
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2010
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Online Access: | http://hdl.handle.net/1969.1/ETD-TAMU-2722 http://hdl.handle.net/1969.1/ETD-TAMU-2722 |