Robust Optimization of Nanometer SRAM Designs

Technology scaling has been the most obvious choice of designers and chip manufacturing companies to improve the performance of analog and digital circuits. With the ever shrinking technological node, process variations can no longer be ignored and play a significant role in determining the performa...

Full description

Bibliographic Details
Main Author: Dayal, Akshit
Other Authors: Li, Peng
Format: Others
Language:en_US
Published: 2011
Subjects:
Online Access:http://hdl.handle.net/1969.1/ETD-TAMU-2009-12-7589