Characterization of surface and layered films with cluster secondary ion mass spectrometry
Cluster secondary ion mass spectrometry (SIMS) analyses of layer-by-layer thin films were performed to investigate the depth/volume of SI emission and accuracy of the SI signal. The thin-layered samples were assembled by alternate adsorption of polyethylenimine (PEI), polystyrene sulfonate (PSS), po...
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| Format: | Others |
| Language: | en_US |
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Texas A&M University
2008
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| Online Access: | http://hdl.handle.net/1969.1/85794 |