Fault simulation and test generation for small delay faults
Delay faults are an increasingly important test challenge. Traditional delay fault models are incomplete in that they model only a subset of delay defect behaviors. To solve this problem, a more realistic delay fault model has been developed which models delay faults caused by the combination of spo...
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| Format: | Others |
| Language: | en_US |
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Texas A&M University
2007
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| Online Access: | http://hdl.handle.net/1969.1/4966 |