Nanoscale characterization of solution-cast poly(vinylidene fluoride) thinfilms using atomic force microscopy
This thesis research focuses on the characterization of thinfilms made of poly(vinylidene fluoride) (PVDF) using an atomic force microscope. Thinfilms of PVDF were fabricated by a spin coating method with different conditions and characterized using the Atomic Force Microscopy (AFM) for morphologica...
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| Format: | Others |
| Language: | en_US |
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Texas A&M University
2007
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| Online Access: | http://hdl.handle.net/1969.1/4790 |