A methodology for memory chip stress levels prediction
The reliability of electronic component plays an important role in proper functioning of the electronic devices. The manufacturer tests electronic components before they are used by end users. Still at times electronic devices fail due to undue stresses existing inside the microelectronic components...
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| Format: | Others |
| Language: | en_US |
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Texas A&M University
2006
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| Online Access: | http://hdl.handle.net/1969.1/4354 |