Approaches to test set generation using binary decision diagrams
This research pursues the use of powerful BDD-based functional circuit analysis to evaluate some approaches to test set generation. Functional representations of the circuit allow the measurement of information about faults that is not directly available through circuit simulation methods, such as...
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| Format: | Others |
| Language: | en_US |
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Texas A&M University
2004
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| Online Access: | http://hdl.handle.net/1969.1/20 |