On the Computation of LFSR Characteristic Polynomials for One-Dimensional and Two-Dimensional Test Pattern Generation
Current methodologies for built-in test pattern generation usually employ a predetermined linear feedback shift register (LFSR) in order to generate or decompress deterministic test patterns. As a direct consequence, the test pattern computation and the fault coverage are constrained to the preselec...
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| Format: | Others |
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OpenSIUC
2014
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| Online Access: | https://opensiuc.lib.siu.edu/dissertations/893 https://opensiuc.lib.siu.edu/cgi/viewcontent.cgi?article=1896&context=dissertations |