Photoemission Electron Microscopy for Analysis of Dielectric Structures and the Goos-Hänchen Shift
Photoemission Electron Microscopy (PEEM) is a versatile tool that relies on the photoelectric effect to produce high-resolution electron images. Ultrafast pulse lasers allow for multi-photon PEEM where multiple visible or IR photons excite a single electron in a nonlinear process. The photoelectron...
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| Format: | Others |
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PDXScholar
2016
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| Online Access: | http://pdxscholar.library.pdx.edu/open_access_etds/2991 http://pdxscholar.library.pdx.edu/cgi/viewcontent.cgi?article=4007&context=open_access_etds |