Analog Implicit Functional Testing using Supervised Machine Learning
Testing analog circuits is more difficult than digital circuits. The reasons for this difficulty include continuous time and amplitude signals, lack of well-accepted testing techniques and time and cost required for its realization. The traditional method for testing analog circuits involves measuri...
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| Format: | Others |
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PDXScholar
2014
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| Online Access: | https://pdxscholar.library.pdx.edu/open_access_etds/2099 https://pdxscholar.library.pdx.edu/cgi/viewcontent.cgi?article=3099&context=open_access_etds |