The Development of Embedded DRAM Statistical Quality Models at Test and Use Conditions
Today, the use of embedded Dynamic Random Access Memory (eDRAM) is increasing in our electronics that require large memories, such as gaming consoles and computer network routers. Unlike external DRAMs, eDRAMs are embedded inside ASICs for faster read and write operations. Until recently, eDRAMs req...
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| Format: | Others |
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PDXScholar
2010
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| Online Access: | https://pdxscholar.library.pdx.edu/open_access_etds/341 https://pdxscholar.library.pdx.edu/cgi/viewcontent.cgi?article=1340&context=open_access_etds |