A Die-level Adaptive Test Scheme for Real-time Test Reordering and Elimination
Semiconductor manufacturing companies aim to achieve shortest test times for products while maintaining the product quality. Achieving shortest test times for devices requires multiple updates to the test flow and test content. Test cost varies in direct proportion to production test time required t...
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| Format: | Others |
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PDXScholar
2011
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| Online Access: | https://pdxscholar.library.pdx.edu/open_access_etds/243 https://pdxscholar.library.pdx.edu/cgi/viewcontent.cgi?article=1242&context=open_access_etds |