The Role of Temperature in Testing Deep Submicron CMOS ASICs

The Role of Temperature in Testing Deep Submicron CMOS ASICs

Among the many efforts to improve the IC test process are tests that attempt to differentiate between healthy and defective or low reliability ICs by manipulating the operating conditions of the IC being tested. This thesis attempts to improve the common understanding of multiple and targeted temper...

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Bibliographic Details
Main Author: Long, Ethan Schuyler
Format: Others
Published: PDXScholar 2003
Subjects:
Complementary Metal oxide semiconductors > Testing
Complementary Metal oxide semiconductors > Thermal properties
Application-specific integrated circuits > Testing
Application-specific integrated circuits > Thermal properties
Integrated circuits > Design and construction
Online Access:https://pdxscholar.library.pdx.edu/open_access_etds/34
https://pdxscholar.library.pdx.edu/cgi/viewcontent.cgi?article=1033&context=open_access_etds

Internet

https://pdxscholar.library.pdx.edu/open_access_etds/34
https://pdxscholar.library.pdx.edu/cgi/viewcontent.cgi?article=1033&context=open_access_etds

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