Comparison of analytic and numerical models with commercially available simulation tools for the prediction of semiconductor freeze-out and exhaustion
Approved for public release; distribution is unlimited === This thesis reports on three procedures and the associated numerical results for obtaining semiconductor majority carrier concentrations when subjected to a temperature sweep. The capability of predicting the exhaustion regime boundaries of...
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Monterey, California. Naval Postgraduate School
2012
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| Online Access: | http://hdl.handle.net/10945/4558 |