Measurement of minority charge carrier diffusion length in Gallium Nitride nanowires using Electron Beam InducedCurrent (EBIC)
Approved for public release, distribution unlimited === Electron Beam Induced Current (EBIC) measurements were performed on GaN nanowires to determine minority charge carrier diffusion length, d L . Although EBIC has been used to characterize bulk and thin film materials, very little is known abo...
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Monterey, California. Naval Postgraduate School
2012
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| Online Access: | http://hdl.handle.net/10945/4363 |