| Summary: | Approved for public release; distribution unlimited. === This thesis describes the need for including design for testability in a VLSI chip design and provides information on implementing a DFT strategy using the GENESIL Silicon compiler. Two structured techniques of design for testability, Scan Design and Built-in Self Test, are discussed. Also, the methodology used to implement the residue code with GENESIL for testing the multiply-add module of a second-order Infinite Impulse Response notch filter is presented. The cost, in terms of increased hardware and decreased performance, associated with implementing the residue code is examined by comparing modulo-3 and modulo-15 checking algorithms.
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