How Miniature/Microminiature (2M) repair capabilities can reduce the impact of No Evidence of Failure (NEOF) among repairables on the Navy's operations and maintenance account/
Today with technical advances and cost reductions in electronics, it has become possible to recategorize many Field Level Repairable (FLRs) and Depot Level Repairable (DLRs) as progressive repairables. This thesis covers the growing problem of No Evidence of Failure (NEOF) among repairables and how...
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| Language: | en_US |
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Monterey, California. Naval Postgraduate School
2012
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| Online Access: | http://hdl.handle.net/10945/23255 |