A hot-stage Atomic Force Microscope for the measurement of plastic deformation in metallic thin films during thermal cycling.
An Atomic Force Microscope is equipped with a hot-stage and a vacuum system in order to enable in-situ studies of plastic deformation and interfacial sliding of thin metallic films on Si substrates during thermal cycling. The apparatus can reach sample temperatures of lOO deg C while maintaining opt...
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2012
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| Online Access: | http://hdl.handle.net/10945/10930 |