Pixe analysis of adjacent elements
Bibliography: pages 58-60. === Proton induced X-ray emission (PIXE) analysis depends on the accurate stripping of the peaks of individual X-rays from the X-ray energy spectrum produced by the bombardment of a target material with charged particles. The energy separation between the Kᵦ X-ray of eleme...
| Main Author: | |
|---|---|
| Other Authors: | |
| Format: | Dissertation |
| Language: | English |
| Published: |
University of Cape Town
2016
|
| Subjects: | |
| Online Access: | http://hdl.handle.net/11427/17373 |