Injection-Avalanche-Based nþpn Silicon Complementary Metal Oxide–Semiconductor Light-Emitting Device (450 – 750 nm) with 2-Order-of-Magnitude Increase in Light Emission Intensity

In this paper, we report on an increase in emission intensity of up to 10 nW/mm2 that has been realized with a new novel two junction, diagonal avalanche control, and minority carrier injection silicon complementary metal–oxide–semiconductor (CMOS) light emitting device (LED). The device utilizes a...

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Bibliographic Details
Main Authors: Snyman, LW, Du Plessis, M, Aharoni, H
Format: Others
Language:en
Published: Japanese Journal of Applied Physics 2007
Subjects:
Online Access:http://encore.tut.ac.za/iii/cpro/DigitalItemViewPage.external?sp=1000813