The selection and single event upset testing of a DSP processor for a LEO satellite

The selection and single event upset testing of a DSP processor for a LEO satellite

Thesis (MScEng)--University of Stellenbosch, 2002. === ENGLISH ABSTRACT: After successful use of a DSP processor onboard the SUNSAT satellite, the need arose for a faster floating-point processor. A list of possible processors was generated from various selection criteria. Two suitable DSP proces...

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Bibliographic Details
Main Author: Berner, Heiko
Other Authors: Blanckenberg, M. M.
Format: Others
Language:en_ZA
Published: Stellenbosch : Stellenbosch University 2012
Subjects:
Signal processing > Digital techniques
Microprocessors > Testing
Electronic apparatus and appliances > Effect of radiation on
Dissertations > Electrical and electronic engineering
Theses > Electrical and electronic engineering
Online Access:http://hdl.handle.net/10019.1/53171

Internet

http://hdl.handle.net/10019.1/53171

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