Genome-Wide Association Mapping of Host Resistance to Stem Rust, Leaf Rust, Tan Spot, and Septoria Nodorum Blotch in Cultivated Emmer Wheat
Cultivated emmer wheat (Triticum turgidum ssp. dicoccum) is a good source of genes for resistance to several major diseases of wheat. The objectives of this study were to use genome-wide association analysis to detect genomic regions in cultivated emmer germplasm harboring novel resistance genes to...
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| Format: | Others |
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North Dakota State University
2015
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| Online Access: | http://hdl.handle.net/10365/24881 |