Diffusion, Deformation, and Damage in Lithium-Ion Batteries and Microelectronics

Diffusion, Deformation, and Damage in Lithium-Ion Batteries and Microelectronics

This thesis explores mechanical behavior of microelectronic devices and lithium-ion batteries. We first examine electromigration-induced void formation in solder bumps by constructing a theory that couples electromigration and creep. The theory can predict the critical current density below which...

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Bibliographic Details
Main Author: Pharr, Matt Mathews
Other Authors: Suo, Zhigang
Language:en_US
Published: Harvard University 2014
Subjects:
Engineering
Mechanics
Materials Science
Fracture
Kinetics
Lithium-ion batteries
Microelectronics
Plasticity
Solders
Online Access:http://dissertations.umi.com/gsas.harvard:11593
http://nrs.harvard.edu/urn-3:HUL.InstRepos:12271804

Internet

http://dissertations.umi.com/gsas.harvard:11593
http://nrs.harvard.edu/urn-3:HUL.InstRepos:12271804

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