Extraction of Nanorod Projections from Scanning Electron Micrographs
The dimensions of nanoobjects are important because the properties of nanoobjects are related to dimension and automatic manufacturing inspection of nanoobject requires dimensional information. The current approaches to estimate the projection lengths (one of the important dimensions of nanorods) ar...
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| Format: | Others |
| Language: | English English |
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Florida State University
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| Online Access: | http://purl.flvc.org/fsu/fd/FSU_migr_etd-9588 |