Formation and characterization of FeSi2 thin films and precipitates prepared by metal vapor vacuum arc (MEVVA) ion implanation.

Formation and characterization of FeSi2 thin films and precipitates prepared by metal vapor vacuum arc (MEVVA) ion implanation.

by Gao Yun. === "November 2002." === Thesis (Ph.D.)--Chinese University of Hong Kong, 2002. === Includes bibliographical references (p. 165-171). === Electronic reproduction. Hong Kong : Chinese University of Hong Kong, [2012] System requirements: Adobe Acrobat Reader. Available via World...

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Bibliographic Details
Other Authors: Gao, Yun.
Format: Others
Language:English
Chinese
Published: 2002
Subjects:
Thin films
Ion implantation
Precipitation (Chemistry)
Vapor-plating
Online Access:http://library.cuhk.edu.hk/record=b6073502
http://repository.lib.cuhk.edu.hk/en/item/cuhk-343260

Internet

http://library.cuhk.edu.hk/record=b6073502
http://repository.lib.cuhk.edu.hk/en/item/cuhk-343260

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