Surface charge spectroscopic studies of fixed oxide charge depth distribution and breakdown properties of ultra-thin SiO₂/Si.
by Fong Hon Hang = 超薄二氧化硅的固定電荷分佈和電擊穿特性 / 方漢鏗. === Thesis (M.Phil.)--Chinese University of Hong Kong, 2000. === Includes bibliographical references. === Text in English; abstracts in English and Chinese. === by Fong Hon Hang = Chao bo er yang hua gui de gu ding dian he fen bu he dian ji chuan te xing...
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| Format: | Others |
| Language: | English Chinese |
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2000
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| Online Access: | http://library.cuhk.edu.hk/record=b5890324 http://repository.lib.cuhk.edu.hk/en/item/cuhk-323200 |