Alloying phenomenon of amorphous silicon and germanium double layers on silicon wafer generated by in-situ thermal pulse =: 原位熱脈衝對硅片上非晶硅鍺雙層薄膜所產生的合金現象.

by Yeung Ching Chung. === Thesis (M.Phil.)--Chinese University of Hong Kong, 1998. === Includes bibliographical references (leaves 69-71). === Text in English; abstract also in Chinese. === by Yeung Ching Chung. === Table of contents --- p.i === Chapter Chapter 1 --- Introduction === Chapter 1.1 --...

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Other Authors: Yeung, Ching Chung.
Format: Others
Language:English
Chinese
Published: 1998
Subjects:
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spelling ndltd-cuhk.edu.hk-oai-cuhk-dr-cuhk_3222962019-02-19T03:58:09Z Alloying phenomenon of amorphous silicon and germanium double layers on silicon wafer generated by in-situ thermal pulse =: 原位熱脈衝對硅片上非晶硅鍺雙層薄膜所產生的合金現象. 原位熱脈衝對硅片上非晶硅鍺雙層薄膜所產生的合金現象 Alloying phenomenon of amorphous silicon and germanium double layers on silicon wafer generated by in-situ thermal pulse =: Yuan wei re mai chong dui gui pian shang fei jing gui zhe shuang ceng bo mo suo chan sheng de he jin xian xiang. Yuan wei re mai chong dui gui pian shang fei jing gui zhe shuang ceng bo mo suo chan sheng de he jin xian xiang Silicon alloys--Heat treatment Germanium alloys--Heat treatment Amorphous semiconductors by Yeung Ching Chung. Thesis (M.Phil.)--Chinese University of Hong Kong, 1998. Includes bibliographical references (leaves 69-71). Text in English; abstract also in Chinese. by Yeung Ching Chung. Table of contents --- p.i Chapter Chapter 1 --- Introduction Chapter 1.1 --- General overview --- p.1 Chapter 1.2 --- The present study --- p.3 Chapter Chapter 2 --- Sample preparation and characterization Chapter 2.1 --- Sample preparation Chapter A. --- General description --- p.5 Chapter B. --- The thermal pulse furnace --- p.7 Chapter C. --- The substrates --- p.9 Chapter D. --- Sample preparation --- p.10 Chapter 2.2 --- Sample characterization Chapter A. --- Micro Raman system --- p.11 Chapter B. --- Rutherford backscattering spectrometry (RBS) --- p.12 Chapter C. --- X-ray powder diffraction --- p.13 Chapter D. --- AFM. SEM and Surface Profiler --- p.13 Chapter Chapter 3 --- Results and discussion Chapter 3.1 --- The surface morphology Chapter A. --- General description --- p.15 Chapter B. --- The as-deposited amorphous film --- p.15 Chapter C. --- The crystalline Ge film --- p.16 Chapter D. --- The alloy film --- p.17 Chapter E. --- The role of a-Si layer --- p.22 Chapter 3.2 --- The depth profile (RBS) Chapter A. --- General description --- p.24 Chapter B. --- Peak temperature dependence --- p.27 Chapter C. --- Heating rate dependence --- p.30 Chapter 3.3 --- The near surface composition measured by Raman scattering Chapter A. --- General description --- p.33 Chapter B. --- Peak temperature dependence --- p.43 Chapter C. --- Heating rate dependence --- p.45 Chapter 3.4 --- Preferred growth direction Chapter A. --- General description --- p.47 Chapter B. --- Peak temperature dependence --- p.48 Chapter C. --- Heating rate dependence --- p.51 Chapter 3.5 --- Discussion Chapter A. --- The particle size --- p.55 Chapter B. --- The participation of Si substrate --- p.58 Chapter C. --- The alloy formation --- p.58 Chapter D. --- The abnormally fast interdiffusion --- p.63 Chapter Chapter 4 --- Conclusion --- p.65 Appendix --- p.67 References --- p.69 Yeung, Ching Chung. Chinese University of Hong Kong Graduate School. Division of Physics. 1998 Text bibliography print iii, 71 leaves : ill. ; 30 cm. cuhk:322296 http://library.cuhk.edu.hk/record=b5889715 eng chi Use of this resource is governed by the terms and conditions of the Creative Commons “Attribution-NonCommercial-NoDerivatives 4.0 International” License (http://creativecommons.org/licenses/by-nc-nd/4.0/) http://repository.lib.cuhk.edu.hk/en/islandora/object/cuhk%3A322296/datastream/TN/view/Alloying%20phenomenon%20of%20amorphous%20silicon%20and%20germanium%20double%20layers%20on%20silicon%20wafer%20generated%20by%20in-situ%20thermal%20pulse%20%3A%20%E5%8E%9F%E4%BD%8D%E7%86%B1%E8%84%88%E8%A1%9D%E5%B0%8D%E7%A1%85%E7%89%87%E4%B8%8A%E9%9D%9E%E6%99%B6%E7%A1%85%E9%8D%BA%E9%9B%99%E5%B1%A4%E8%96%84%E8%86%9C%E6%89%80%E7%94%A2%E7%94%9F%E7%9A%84%E5%90%88%E9%87%91%E7%8F%BE%E8%B1%A1.jpghttp://repository.lib.cuhk.edu.hk/en/item/cuhk-322296
collection NDLTD
language English
Chinese
format Others
sources NDLTD
topic Silicon alloys--Heat treatment
Germanium alloys--Heat treatment
Amorphous semiconductors
spellingShingle Silicon alloys--Heat treatment
Germanium alloys--Heat treatment
Amorphous semiconductors
Alloying phenomenon of amorphous silicon and germanium double layers on silicon wafer generated by in-situ thermal pulse =: 原位熱脈衝對硅片上非晶硅鍺雙層薄膜所產生的合金現象.
description by Yeung Ching Chung. === Thesis (M.Phil.)--Chinese University of Hong Kong, 1998. === Includes bibliographical references (leaves 69-71). === Text in English; abstract also in Chinese. === by Yeung Ching Chung. === Table of contents --- p.i === Chapter Chapter 1 --- Introduction === Chapter 1.1 --- General overview --- p.1 === Chapter 1.2 --- The present study --- p.3 === Chapter Chapter 2 --- Sample preparation and characterization === Chapter 2.1 --- Sample preparation === Chapter A. --- General description --- p.5 === Chapter B. --- The thermal pulse furnace --- p.7 === Chapter C. --- The substrates --- p.9 === Chapter D. --- Sample preparation --- p.10 === Chapter 2.2 --- Sample characterization === Chapter A. --- Micro Raman system --- p.11 === Chapter B. --- Rutherford backscattering spectrometry (RBS) --- p.12 === Chapter C. --- X-ray powder diffraction --- p.13 === Chapter D. --- AFM. SEM and Surface Profiler --- p.13 === Chapter Chapter 3 --- Results and discussion === Chapter 3.1 --- The surface morphology === Chapter A. --- General description --- p.15 === Chapter B. --- The as-deposited amorphous film --- p.15 === Chapter C. --- The crystalline Ge film --- p.16 === Chapter D. --- The alloy film --- p.17 === Chapter E. --- The role of a-Si layer --- p.22 === Chapter 3.2 --- The depth profile (RBS) === Chapter A. --- General description --- p.24 === Chapter B. --- Peak temperature dependence --- p.27 === Chapter C. --- Heating rate dependence --- p.30 === Chapter 3.3 --- The near surface composition measured by Raman scattering === Chapter A. --- General description --- p.33 === Chapter B. --- Peak temperature dependence --- p.43 === Chapter C. --- Heating rate dependence --- p.45 === Chapter 3.4 --- Preferred growth direction === Chapter A. --- General description --- p.47 === Chapter B. --- Peak temperature dependence --- p.48 === Chapter C. --- Heating rate dependence --- p.51 === Chapter 3.5 --- Discussion === Chapter A. --- The particle size --- p.55 === Chapter B. --- The participation of Si substrate --- p.58 === Chapter C. --- The alloy formation --- p.58 === Chapter D. --- The abnormally fast interdiffusion --- p.63 === Chapter Chapter 4 --- Conclusion --- p.65 === Appendix --- p.67 === References --- p.69
author2 Yeung, Ching Chung.
author_facet Yeung, Ching Chung.
title Alloying phenomenon of amorphous silicon and germanium double layers on silicon wafer generated by in-situ thermal pulse =: 原位熱脈衝對硅片上非晶硅鍺雙層薄膜所產生的合金現象.
title_short Alloying phenomenon of amorphous silicon and germanium double layers on silicon wafer generated by in-situ thermal pulse =: 原位熱脈衝對硅片上非晶硅鍺雙層薄膜所產生的合金現象.
title_full Alloying phenomenon of amorphous silicon and germanium double layers on silicon wafer generated by in-situ thermal pulse =: 原位熱脈衝對硅片上非晶硅鍺雙層薄膜所產生的合金現象.
title_fullStr Alloying phenomenon of amorphous silicon and germanium double layers on silicon wafer generated by in-situ thermal pulse =: 原位熱脈衝對硅片上非晶硅鍺雙層薄膜所產生的合金現象.
title_full_unstemmed Alloying phenomenon of amorphous silicon and germanium double layers on silicon wafer generated by in-situ thermal pulse =: 原位熱脈衝對硅片上非晶硅鍺雙層薄膜所產生的合金現象.
title_sort alloying phenomenon of amorphous silicon and germanium double layers on silicon wafer generated by in-situ thermal pulse =: 原位熱脈衝對硅片上非晶硅鍺雙層薄膜所產生的合金現象.
publishDate 1998
url http://library.cuhk.edu.hk/record=b5889715
http://repository.lib.cuhk.edu.hk/en/item/cuhk-322296
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