Measurement of Annealing Phenomena in High Purity Metals with Near-field High Energy X-ray Diffraction Microscopy
The forward modeling method (FMM) for analysis of near-field High Energy X-ray Diffraction Microscopy (nfHEDM) has emerged as a powerful tool for materials characterization, with the ability to non-destructively measure microstructures deep within the bulk of materials. A synchrotron based technique...
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| Format: | Others |
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Research Showcase @ CMU
2012
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| Online Access: | http://repository.cmu.edu/dissertations/135 http://repository.cmu.edu/cgi/viewcontent.cgi?article=1141&context=dissertations |