Imaging of Orientation and Geometry in Microstructures: Development and Applications of High Energy X-ray Diffraction Microscopy
Near-field High Energy X-ray Diffraction Microscopy (HEDM) is a synchrotron based imaging technique capable of resolving crystallographic orientation in a bulk, polycrystalline material non-destructively. Recent advances in data acquisition and analysis methods have led to micron-scale spatial resol...
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| Format: | Others |
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Research Showcase @ CMU
2011
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| Online Access: | http://repository.cmu.edu/dissertations/59 http://repository.cmu.edu/cgi/viewcontent.cgi?article=1064&context=dissertations |