Real-time X-ray studies of fundamental surface growth processes
In this research, some fundamental aspects of surface growth processes are investigated through in-situ synchrotron based x-ray techniques, including a new coherent x-ray technique developed as part of this work, as well as ex-situ Atomic Force Microscopy (AFM), Scanning Electron Microscopy (SEM) an...
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| Language: | en_US |
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2015
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| Online Access: | https://hdl.handle.net/2144/13675 |