Increasing resolution and light efficiency in fluorescence microscopy

Structured illumination microscopy (SIM) can be used to enhance the lateral resolu-tion and the sectioning capability in microscopic imaging. As a wide-field technique it may have advantages over scanning approaches such as stimulated emission depletion (STED) microscopy regarding acquisition time a...

Full description

Bibliographic Details
Main Author: Wicker, Kai
Other Authors: Heintzmann, Rainer Walther ; Suhling, Klaus
Published: King's College London (University of London) 2010
Online Access:https://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.754972