Single event upset mitigation techniques in reconfigurable hardware
Advances in semiconductor technology using smaller sizes of transistors in order to fit more of them in the same area and increase performance, pose a threat for the reliability of integrated circuits. Technology scaling accelerates transistor ageing and degradation, causing more faults during the l...
| Main Author: | |
|---|---|
| Other Authors: | |
| Published: |
Imperial College London
2017
|
| Subjects: | |
| Online Access: | https://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.726976 |