Far infrared reflection spectroscopy of layered semiconductors
The optical properties of a selection of layered semiconductor samples have been studied in the far-infrared by reflection dispersive Fourier transform spectroscopy (DFTS) and attenuated total reflection (ATR) spectroscopy in DFTS the reference mirror in a two-beam Michelson interferometer is replac...
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Royal Holloway, University of London
1989
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| Online Access: | http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.704463 |