Surface profile measurement using spatially dispersed short coherence interferometry

Modern manufacturing processes require better quality control of the manufactured products at a faster rate, for achieving good throughput. This is increasing the need for process-oriented precision metrology capable of providing faster inspection and yielding valuable feedback to the manufacturing...

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Bibliographic Details
Main Author: Hassan, Mothana A.
Other Authors: Jiang, Xiangqian
Published: University of Huddersfield 2015
Subjects:
Online Access:http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.686202