Low frequency noise in silicon carbide & graphene electronics
The electrical noise phenomenon in semiconductor devices has been an on-going research topic throughout the evolution of semiconductors, having been discovered in the characteristics of a vacuum tube [1]. Being a naturally occurring phenomenon, due to the microscopic interaction of conducting carrie...
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University of Newcastle upon Tyne
2015
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| Online Access: | http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.674783 |