Digital parametric testing
As minimum geometries of VLSI processes continue to shrink there have been two main effects on the field of parametric test. Firstly, structures must be able to characterise these smaller geometries and secondly the space for test structures has become more limited due to the requirement for them to...
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University of Edinburgh
1991
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| Online Access: | http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.663469 |